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BAT54STA RN2006 LC66512 K03B7 HIN202E 1N5620US 2SC10 EDZ36B
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For prolonged Found Datasheets File :: 3154    Search Time::1.609ms    
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    74F138 I74F138D I74F138N N74F138D N74F138N 74F138_2

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. 74F138 I74F138D I74F138N N74F138D N74F138N 74F138_2
OCR Text ... operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description From old datasheet system
1-of-8 decoder/demultiplexer

File Size 85.25K  /  8 Page

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    74F139 N74F139D N74F139N 74F139_2

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. 74F139 N74F139D N74F139N 74F139_2
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description From old datasheet system
Dual 1-of-4 decoder/demultiplexer

File Size 75.30K  /  8 Page

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    74F151A N74F151AD N74F151AN 74F151

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F151A N74F151AD N74F151AN 74F151
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description 8-input multiplexer

File Size 80.99K  /  10 Page

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    74F157 74F157A I74F157AD I74F157AN N74F157AD N74F157AN 74F158 N174F158AN N74F158AD 74F158A

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F157 74F157A I74F157AD I74F157AN N74F157AD N74F157AN 74F158 N174F158AN N74F158AD 74F158A
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description Data selectors/multiplexers

File Size 84.78K  /  10 Page

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    74F164 74F164D 74F164N I74F164D I74F164N

PHILIPS[Philips Semiconductors]
Part No. 74F164 74F164D 74F164N I74F164D I74F164N
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter test, IOS tests should be perform...
Description 8-bit serial-in parallel-out shift register

File Size 83.15K  /  10 Page

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    74F174 N74F174D N74F174N 74F174_2

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. 74F174 N74F174D N74F174N 74F174_2
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description From old datasheet system
Hex D flip-flops

File Size 75.99K  /  8 Page

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    74F175A 74F175AD 74F175AN

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F175A 74F175AD 74F175AN
OCR Text ... operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description Quad D flip-flop

File Size 82.31K  /  10 Page

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    74F245 N74F245 N74F245D N74F245DB N74F245N

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F245 N74F245 N74F245D N74F245DB N74F245N
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description Octal transceiver (3-State)
Octal transceiver 3-State

File Size 92.00K  /  10 Page

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    74F251A N74F251AD N74F251AN

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F251A N74F251AD N74F251AN
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description 8-input multiplexer 3-State

File Size 42.09K  /  5 Page

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    74F258A N74F258AD N74F258AN 74F258A_2

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. 74F258A N74F258AD N74F258AN 74F258A_2
OCR Text ... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description Quad 2-line to 1-line selector/multiplexer / inverting 3-State
Quad 2-line to 1-line selector/multiplexer, inverting 3-State
Quad 2-line to 1-line selector/multiplexer inverting 3-State
From old datasheet system

File Size 74.18K  /  8 Page

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