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For methodology Found Datasheets File :: 1655    Search Time::1.313ms    
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    MW6IC1940GNBR1

Freescale Semiconductor, Inc
Part No. MW6IC1940GNBR1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22--A114) Machine Model (per EIA/JESD22--A115) Charge Device Model (per JESD22--C101) Class 1B (Minimum) A (Minimum) IV (Minimum) Table 4. Moisture Sensitivity Level ...
Description RF LDMOS Wideband Integrated Power Amplifier

File Size 845.42K  /  17 Page

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    MW7IC2040GNR1 MW7IC2040N MW7IC2040NBR1 MW7IC2040NR1

NXP Semiconductors
Part No. MW7IC2040GNR1 MW7IC2040N MW7IC2040NBR1 MW7IC2040NR1
OCR Text ...protection characteristics test methodology class human body model (per jesd22 - a114) 1b (minimum) machine model (per eia/jesd22 - a115) a (minimum) charge device model (per jesd22 - c101) iii (minimum) table 4. moisture sensitivity level ...
Description RF LDMOS Wideband Integrated Power Amplifiers

File Size 1,024.57K  /  29 Page

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    MW6S010GNR1 MW6S010N

NXP Semiconductors
Part No. MW6S010GNR1 MW6S010N
OCR Text ...to an1955, thermal measurement methodology of rf power amplifiers. go to http://www.freescale.com/rf . select documentation/application notes - an1955. document number: mw6s010n rev. 5, 6/2009 freescale semiconductor technical data mw6...
Description RF Power Field Effect Transistors

File Size 794.71K  /  20 Page

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    MW6S004N MW6S004NT1

NXP Semiconductors
Part No. MW6S004N MW6S004NT1
OCR Text ...protection characteristics test methodology class human body model (per jesd22 - a114) 1c (minimum) machine model (per eia/jesd22 - a115) a (minimum) charge device model (per jesd22 - c101) iv (minimum) 1. mttf calculator available at http:...
Description RF Power Field Effect Transistor

File Size 542.00K  /  13 Page

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    MW7IC2425NR1

Freescale Semiconductor, Inc
Part No. MW7IC2425NR1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22 - A114) Machine Model (per EIA/JESD22 - A115) Charge Device Model (per JESD22 - C101) Class 1B (Minimum) A (Minimum) II (Minimum) Table 4. Moisture Sensitivity Leve...
Description RF Power Field Effect Transistors N-Channel Enhancement-Mode Lateral MOSFETs

File Size 834.92K  /  21 Page

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    9C12063A10R0FKHFT ATC100B3R0BT500XT ATC100B4R3BT500XT ATC100B4R7BT500XT WCR08051KFI C5750X5R1H106M RO4350 222212018221 M

Freescale Semiconductor, Inc
Part No. 9C12063A10R0FKHFT ATC100B3R0BT500XT ATC100B4R3BT500XT ATC100B4R7BT500XT WCR08051KFI C5750X5R1H106M RO4350 222212018221 MRF8S9102NR3
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22--A114) Machine Model (per EIA/JESD22--A115) Charge Device Model (per JESD22--C101) Class 2 (Minimum) A (Minimum) IV (Minimum) Table 4. Moisture Sensitivity Level T...
Description RF Power Field Effect Transistor

File Size 806.79K  /  16 Page

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    MRF6V10010NR4

Freescale Semiconductor, Inc
Part No. MRF6V10010NR4
OCR Text ... to AN1955, Thermal Measurement methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. (c) Freescale Semiconductor, Inc., 2008--2010. All rights reserved. MRF6V10010NR4...
Description RF Power Field Effect Transistor N-Channel Enhancement-Mode Lateral MOSFET

File Size 638.72K  /  10 Page

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    0603CS-30NXJLW GJM1555C1HR80BB01D GRM188R71H104KA93D MMG15241HT1 GJM1555C1HR70BB01D GJM1555C1H5R6DB01D GJM1555C1H1R5CB01

Freescale Semiconductor, Inc
Part No. 0603CS-30NXJLW GJM1555C1HR80BB01D GRM188R71H104KA93D MMG15241HT1 GJM1555C1HR70BB01D GJM1555C1H5R6DB01D GJM1555C1H1R5CB01D IS680-338 GRM188RC1H560GA01D
OCR Text ... to AN1955, Thermal Measurement methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. (c) Freescale Semiconductor, Inc., 2010. All rights reserved. MMG15241HT1 1 RF...
Description Enhancement Mode pHEMT Technology (E-pHEMT)

File Size 759.51K  /  18 Page

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    A2T21S260W12NR3

NXP Semiconductors
Part No. A2T21S260W12NR3
OCR Text ...protection characteristics test methodology class human body model (per jesd22--a114) 2 charge device model (per jesd22--c101) c3 table 4. moisture sensitivity level test methodology rating package peak temperature unit per jesd22--a113, ip...
Description N--Channel Enhancement--Mode Lateral MOSFET

File Size 332.74K  /  14 Page

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    MRF6S18060NBR1 MRF6S18060NR1 MRF6S18060NR108

Freescale Semiconductor, Inc
Part No. MRF6S18060NBR1 MRF6S18060NR1 MRF6S18060NR108
OCR Text ... to AN1955, Thermal Measurement methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. (c) Freescale Semiconductor, Inc., 2006, 2008. All rights reserved. MRF6S18060NR1 ...
Description RF Power Field Effect Transistors N-Channel Enhancement-Mode Lateral MOSFETs

File Size 762.03K  /  21 Page

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For methodology Found Datasheets File :: 1655    Search Time::1.313ms    
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