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HAT2285WP Silicon N Channel Power MOS FET with Schottky Barrier Diode High Speed Power Switching REJ03G1371-0300 Rev.3.00 Apr 05, 2006 Features * * * * Low on-resistance Capable of 4.5 V gate drive High density mounting Built-in Schottky Barrier Diode Outline RENESAS Package code: PWSN0008DB-A (Package name: WPAK-D) 78 D1 D1 56 S1/D2 S1/D2 5678 2 G1 4 G2 4 321 S1/D2(kelvin) 1 S2 3 1, 3 Source 2, 4 Gate 5, 6, 7, 8 Drain MOS2 and Schottky Barrier Diode MOS1 Absolute Maximum Ratings (Ta = 25C) Item Drain to source voltage Gate to source voltage Drain current Drain peak current Reverse drain current Channel dissipation Channel temperature Storage temperature Symbol VDSS VGSS ID ID(pulse)Note1 IDR Pch Note2 Tch Tstg Ratings MOS1 30 20 14 56 14 8 150 -55 to +150 MOS2 & SBD 30 12 22 88 22 15 150 -55 to +150 Unit V V A A A W C C Notes: 1. PW 10 s, duty cycle 1 % 2. Tc = 25C Rev.3.00 Apr 05, 2006 page 1 of 9 HAT2285WP Electrical Characteristics * MOS1 (Ta = 25C) Item Drain to source breakdown voltage Gate to source leak current Zero gate voltage drain current Gate to source cutoff voltage Static drain to source on state resistance Forward transfer admittance Input capacitance Output capacitance Reverse transfer capacitance Total gate charge Gate to source charge Gate to drain charge Turn-on delay time Rise time Turn-off delay time Fall time Body-drain diode forward voltage Body-drain diode reverse recovery time Notes: 3. Pulse test Symbol V(BR)DSS IGSS IDSS VGS(off) RDS(on) RDS(on) |yfs| Ciss Coss Crss Qg Qgs Qgd td(on) tr td(off) tf VDF trr Min 30 -- -- 1.0 -- -- 10 -- -- -- -- -- -- -- -- -- -- -- -- Typ -- -- -- -- 19 27 18 630 155 57 4.6 2.2 1.2 7 30 35 3.6 0.91 18 Max -- 0.1 1 2.5 24 40 -- -- -- -- -- -- -- -- -- -- -- 1.19 -- Unit V A A V m m S pF pF pF nC nC nC ns ns ns ns V ns Test Conditions ID = 10 mA, VGS = 0 VGS = 20 V, VDS = 0 VDS = 30 V, VGS = 0 VDS = 10 V, ID = 1 mA ID = 7 A, VGS = 10 V Note3 ID = 7 A, VGS = 4.5 V Note3 ID = 7 A, VDS = 10 V Note3 VDS = 10 V, VGS = 0, f = 1MHz VDD = 10 V, VGS = 4.5 V, ID = 14 A VGS =10 V, ID = 7 A, VDD 10 V, RL = 1.42 , Rg = 4.7 IF = 14 A, VGS = 0 Note3 IF =14 A, VGS = 0 diF/ dt = 100 A/s * MOS2 & Schottky Barrier Diode (Ta = 25C) Item Drain to source breakdown voltage Gate to source leak current Zero gate voltage drain current Gate to source cutoff voltage Static drain to source on state resistance Forward transfer admittance Input capacitance Output capacitance Reverse transfer capacitance Total gate charge Gate to source charge Gate to drain charge Turn-on delay time Rise time Turn-off delay time Fall time Schottky Barrier diode forward voltage Body-drain diode reverse recovery time Notes: 3. Pulse test Symbol V(BR)DSS IGSS IDSS VGS(off) RDS(on) RDS(on) |yfs| Ciss Coss Crss Qg Qgs Qgd td(on) tr td(off) tf VF trr Min 30 -- -- 1.4 -- -- 24 -- -- -- -- -- -- -- -- -- -- -- -- Typ -- -- -- -- 14 15 40 1930 300 130 18 5.8 4.5 10 20 45 4.0 0.5 16 Max -- 0.1 1 2.5 18 23 -- -- -- -- -- -- -- -- -- -- -- -- -- Unit V A mA V m m S pF pF pF nC nC nC ns ns ns ns V ns Test Conditions ID = 10 mA, VGS = 0 VGS = 12 V, VDS = 0 VDS = 30 V, VGS = 0 VDS = 10 V, ID =1 mA ID =11 A, VGS = 10 V Note3 ID = 11 A, VGS = 4.5 V Note3 ID = 11 A, VDS = 10 V Note3 VDS = 10 V, VGS = 0, f = 1MHz VDD = 10 V, VGS = 4.5 V, ID = 22 A VGS = 10 V, ID = 11 A, VDD 10 V, RL = 0.91 , Rg = 4.7 IF = 3.5 A, VGS = 0 Note3 IF = 22 A, VGS = 0 diF/ dt = 100 A/s Rev.3.00 Apr 05, 2006 page 2 of 9 HAT2285WP Electrical Characteristics * MOS1 Power vs. Temperature Derating 16 1000 100 10 s 1 m 100 s PW s DC = Op 10 era ms tio n Maximum Safe Operation Area Channel Dissipation Pch (W) 12 Drain Current ID (A) 10 8 1 4 Operation in this area is 0.1 limited by RDS(on) Tc = 25C 0.01 1 shot Pulse 0.1 1 0 50 100 150 200 10 100 Case Temperature Tc (C) Drain to Source Voltage VDS (V) Typical Output Characteristics 20 4.5 V 10 V 3.6 V 20 Typical Transfer Characteristics VDS = 10 V Pulse Test Drain Current ID (A) 10 3.2 V Drain Current ID (A) 10 VGS = 2.8 V Pulse Test 0 5 10 Tc = 75C 25C -25C 0 2 4 6 8 10 Drain to Source Voltage VDS (V) Drain to Source Saturation Voltage vs Gate to Source Voltage Drain to Source Voltage VDS(on) (mV) 200 Pulse Test 150 Gate to Source Voltage VGS (V) Static Drain to Source on State Resistance RDS(on) (m) Static Drain to Source on State Resistance vs. Drain Current 100 VGS = 4.5 V 10 V 10 100 ID = 5 A 50 2A 1A 0 1 0.1 1 Pulse Test 10 100 4 8 12 16 20 Gate to Source Voltage VGS (V) Drain Current ID (A) Rev.3.00 Apr 05, 2006 page 3 of 9 HAT2285WP Static Drain to Source on State Resistance vs. Temperature 50 Static Drain to Source on State Resistance RDS(on) (m) Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) 100 50 Tc = -25C 20 10 5 25C 2 1 0.5 0.2 0.1 0.1 0.2 0.5 1 2 VDS = 10 V Pulse Test 5 10 20 50 100 75C Pulse Test ID = 1 A, 2 A 5A 40 VGS = 4.5 V 30 20 10 V 10 0 -25 1 A, 2 A, 5 A 0 25 50 75 100 125 150 Case Temperature Tc (C) Drain Current ID (A) Body-Drain Diode Reverse Recovery Time Reverse Recovery Time trr (ns) 100 50 10000 5000 Typical Capacitance vs. Drain to Source Voltage VGS = 0 f = 1 MHz Capacitance C (pF) 2000 1000 500 200 100 50 20 10 0 5 10 15 20 25 30 Crss Coss Ciss 20 10 5 di / dt = 100 A / s VGS = 0, Ta = 25C 0.3 1 3 10 30 100 2 1 0.1 Reverse Drain Current IDR (A) Drain to Source Voltage VDS (V) Dynamic Input Characteristics Drain to Source Voltage VDS (V) Gate to Source Voltage VGS (V) 50 ID = 14 A VDD = 25 V 10 V 5V VGS VDS 20 100 Switching Characteristics tr 40 16 Switching Time t (ns) 50 td(off) 30 12 20 10 td(on) 5 tf 2 VGS = 10 V, VDD = 10 V Rg =4.7 , duty 1 % 0.5 1 2 5 10 20 50 100 20 8 10 VDD = 25 V 10 V 5V 4 8 12 16 4 0 20 0 1 0.1 0.2 Gate Charge Qg (nC) Drain Current ID (A) Rev.3.00 Apr 05, 2006 page 4 of 9 HAT2285WP Reverse Drain Current vs. Source to Drain Voltage 20 Reverse Drain Current IDR (A) 10 V 5V 10 VGS = 0 V, -5 V Pulse Test 0 0.4 0.8 1.2 1.6 2.0 Source to Drain Voltage VSD (V) Normalized Transient Thermal Impedance s (t) Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25C 1 D=1 0.5 0.3 0.2 0.1 0.1 0.05 02 0.03 0. 1 e 0.0 puls ot h 1s 0.01 10 100 ch - c (t) = s (t) * ch - c ch - c = 15.6C/W, Tc = 25C PDM PW T 1m 10 m 100 m 1 10 D= PW T Pulse Width PW (s) Switching Time Test Circuit Vin Monitor D.U.T. Rg RL VDS = 10 V Vin Vout Vin 10 V Vout Monitor 10% 10% 10% Switching Time Waveform 90% 90% td(on) tr 90% td(off) tf Rev.3.00 Apr 05, 2006 page 5 of 9 HAT2285WP * MOS2 & Schottky Barrier Diode Power vs. Temperature Derating 40 1000 Maximum Safe Operation Area Channel Dissipation Pch (W) Drain Current ID (A) 100 30 20 10 10 s 1 1 m 00 PW s DC = 1 s 10 Op 0 m era s tio n 1 Operation in this area is limited by RDS(on) 0.1 Tc = 25C 0 50 100 150 200 0.01 1 shot Pulse 0.1 1 10 100 Case Temperature Tc (C) Drain to Source Voltage VDS (V) Typical Output Characteristics 20 5V 10 V Pulse Test 20 Typical Transfer Characteristics VDS = 10 V Pulse Test Drain Current ID (A) 10 2.6 V Drain Current ID (A) 2.8 V 10 2.4 V VGS = 2.3 V Tc = 75C 25C -25C 0 1 2 3 4 5 0 5 10 Drain to Source Voltage VDS (V) Drain to Source Saturation Voltage vs Gate to Source Voltage Drain to Source Voltage VDS(on) (mV) 160 Pulse Test Gate to Source Voltage VGS (V) Static Drain to Source on State Resistance RDS(on) (m) Static Drain to Source on State Resistance vs. Drain Current 100 Pulse Test 120 VGS = 4.5 V 10 10 V 80 ID = 5 A 40 2A 1A 0 1 0.1 1 10 100 2 4 6 8 10 12 Gate to Source Voltage VGS (V) Drain Current ID (A) Rev.3.00 Apr 05, 2006 page 6 of 9 HAT2285WP Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) 100 50 20 10 5 2 1 0.5 0.2 0.1 0.1 0.2 0.5 1 2 VDS = 10 V Pulse Test 5 10 20 50 100 75C 25C Tc = -25C Static Drain to Source on State Resistance RDS(on) (m) Static Drain to Source on State Resistance vs. Temperature 50 Pulse Test 40 30 1 A, 2 A, 5 A 20 VGS = 4.5 V 1 A, 2 A, 5 A 10 0 -25 10 V 0 25 50 75 100 125 150 Case Temperature Tc (C) Drain Current ID (A) Body-Drain Diode Reverse Recovery Time Reverse Recovery Time trr (ns) 100 50 Typical Capacitance vs. Drain to Source Voltage 10000 5000 VGS = 0 f = 1 MHz 2000 1000 500 Coss 200 100 50 20 10 100 0 5 10 15 20 25 30 Crss 20 10 5 di / dt = 100 A / s VGS = 0, Ta = 25C 0.3 1 3 10 30 2 1 0.1 Reverse Drain Current IDR (A) Capacitance C (pF) Ciss Drain to Source Voltage VDS (V) Dynamic Input Characteristics Drain to Source Voltag VDS (V) VGS Switching Characteristics Gate to Source Voltage VGS (V) 10 100 50 td(off) tr td(on) 50 ID = 22 A VDD = 25 V 10 V 5V VDS 40 8 Switching Time t (ns) 20 10 5 30 6 20 4 tf 2 VGS = 10 V, VDD = 10 V Rg =4.7 , duty 1 % 2 5 10 20 50 100 10 VDD = 25 V 10 V 5V 10 20 30 40 2 0 50 0 1 0.1 0.2 0.5 1 Gate Charge Qg (nC) Drain Current ID (A) Rev.3.00 Apr 05, 2006 page 7 of 9 HAT2285WP Reverse Drain Current vs. Source to Drain Voltage 20 Reverse Drain Current IDR (A) 10 V VGS = 0 V, -5 V 5V 10 Pulse Test 0 0.4 0.8 1.2 1.6 2.0 Source to Drain Voltage VSD (V) Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance s (t) 3 Tc = 25C 1 D=1 0.5 0.2 0.3 0.1 0.1 ch - c (t) = s (t) * ch - c ch - c = 8.33C/W, Tc = 25C PDM PW T 1m 10 m 100 m 1 10 D= PW T 0.05 2 0.03 0.0 e .01 puls 0 t ho 1s 0.01 10 100 Pulse Width PW (s) Switching Time Test Circuit Vin Monitor D.U.T. Rg RL VDS = 10 V Vin Vout Vin 10 V Vout Monitor Switching Time Waveform 90% 10% 10% 10% 90% td(on) tr 90% td(off) tf Rev.3.00 Apr 05, 2006 page 8 of 9 HAT2285WP Package Dimensions Package Name WPAK-D JEITA Package Code RENESAS Code PWSN0008DB-A Previous Code WPAK-DV MASS[Typ.] 0.07 Unit: mm 0.5 0.15 4.21Typ 1.27Typ 5.1 0.2 0.8Max 1.7 1.7 5.9 +0.1 -0.2 3.8 0.2 6.1 +0.1 -0.3 0.5 0.04Min 0.7Typ 0.635Max 1.27Typ 0.2Typ 0.5 0.15 0.4 0.06 0.05Max 0Min Stand-off 4.9 0.1 (Ni/Pd/Au plating) Notice:The reverse pattern of die-pad support lead described above exists. Ordering Information Part Name HAT2285WP-EL-E Quantity 2500 pcs Taping Shipping Container Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.3.00 Apr 05, 2006 page 9 of 9 Sales Strategic Planning Div. Keep safety first in your circuit designs! Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. Renesas Technology Corp. assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. 3. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Renesas Technology Corp. without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. Renesas Technology Corp. assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information published by Renesas Technology Corp. by various means, including the Renesas Technology Corp. Semiconductor home page (http://www.renesas.com). 4. When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the information and products. Renesas Technology Corp. assumes no responsibility for any damage, liability or other loss resulting from the information contained herein. 5. Renesas Technology Corp. semiconductors are not designed or manufactured for use in a device or system that is used under circumstances in which human life is potentially at stake. Please contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. 6. The prior written approval of Renesas Technology Corp. is necessary to reprint or reproduce in whole or in part these materials. 7. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. 8. Please contact Renesas Technology Corp. for further details on these materials or the products contained therein. RENESAS SALES OFFICES Refer to "http://www.renesas.com/en/network" for the latest and detailed information. Renesas Technology America, Inc. 450 Holger Way, San Jose, CA 95134-1368, U.S.A Tel: <1> (408) 382-7500, Fax: <1> (408) 382-7501 Renesas Technology Europe Limited Dukes Meadow, Millboard Road, Bourne End, Buckinghamshire, SL8 5FH, U.K. Tel: <44> (1628) 585-100, Fax: <44> (1628) 585-900 Renesas Technology (Shanghai) Co., Ltd. Unit 204, 205, AZIACenter, No.1233 Lujiazui Ring Rd, Pudong District, Shanghai, China 200120 Tel: <86> (21) 5877-1818, Fax: <86> (21) 6887-7898 Renesas Technology Hong Kong Ltd. 7th Floor, North Tower, World Finance Centre, Harbour City, 1 Canton Road, Tsimshatsui, Kowloon, Hong Kong Tel: <852> 2265-6688, Fax: <852> 2730-6071 Renesas Technology Taiwan Co., Ltd. 10th Floor, No.99, Fushing North Road, Taipei, Taiwan Tel: <886> (2) 2715-2888, Fax: <886> (2) 2713-2999 Renesas Technology Singapore Pte. Ltd. 1 Harbour Front Avenue, #06-10, Keppel Bay Tower, Singapore 098632 Tel: <65> 6213-0200, Fax: <65> 6278-8001 Renesas Technology Korea Co., Ltd. Kukje Center Bldg. 18th Fl., 191, 2-ka, Hangang-ro, Yongsan-ku, Seoul 140-702, Korea Tel: <82> (2) 796-3115, Fax: <82> (2) 796-2145 http://www.renesas.com Renesas Technology Malaysia Sdn. Bhd Unit 906, Block B, Menara Amcorp, Amcorp Trade Centre, No.18, Jalan Persiaran Barat, 46050 Petaling Jaya, Selangor Darul Ehsan, Malaysia Tel: <603> 7955-9390, Fax: <603> 7955-9510 (c) 2006. Renesas Technology Corp., All rights reserved. Printed in Japan. Colophon .6.0 |
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